This study investigated the relationship between specific cognitive patterns of strengths and weaknesses and the errors children make on oral language, reading, writing, spelling, and math subtests from the Kaufman Test of Educational Achievement–Third Edition (KTEA-3). Participants with scores from the KTEA-3 and either the Wechsler Intelligence Scale for Children–Fifth Edition (WISC-V), Differential Ability Scales–Second Edition (DAS-II), or Kaufman Assessment Battery for Children–Second Edition (KABC-II) were selected based on their profile of scores. Error factor scores for the oral and written language tests were compared for three groups: High Gc paired with low processing speed, long-term memory, and/or reasoning abilities; Low Gc paired with high speed, memory, and/or reasoning; and Low orthographic and/or phonological processing. Error factor scores for the math tests were compared for three groups: High Gc profile; High Gf paired with low processing speed and/or long-term memory; and Low Gf paired with high processing speed and/or long-term memory. Results indicated a difference in Oral Expression and Written Expression error factor scores between the group with High Gc paired with low processing speed, long-term memory, and/or reasoning abilities; and the group with Low Gc paired with high speed, memory, and/or reasoning.