A Reformulated Correlated Trait-Correlated Method Model for Multitrait-Multimethod Data Effectively Increases Convergence and Admissibility Rates
Educational and Psychological Measurement
Published online on November 11, 2016
Abstract
The correlated trait–correlated method (CTCM) model for the analysis of multitrait–multimethod (MTMM) data is known to suffer convergence and admissibility (C&A) problems. We describe a little known and seldom applied reparameterized version of this model (CTCM-R) based on Rindskopf’s reparameterization of the simpler confirmatory factor analysis model. In a Monte Carlo study, we compare the CTCM, CTCM-R, and the correlated trait–correlated uniqueness (CTCU) models in terms of C&A, model fit, and parameter estimation bias. The CTCM-R model largely avoided C&A problems associated with the more traditional CTCM model, producing C&A solutions nearly as often as the CTCU model, but also avoiding parameter estimation biases known to plague the CTCU model. As such, the CTCM-R model is an attractive alternative for the analysis of MTMM data.