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A new memory-coupled multi-regime NHPP framework for reliability growth with partial reset

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Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability

Published online on

Abstract

Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability, Ahead of Print.
Reliability growth modeling plays an important role in the analysis of repairable systems operating under evolving and non-stationary conditions; however, classical formulations such as Crow–AMSAA and Musa–Okumoto generally rely on single-regime ...